A millisecond X-ray reflectometer

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dc.contributor.authorWhite, John
dc.contributor.authorBrown, A S
dc.contributor.authorGarrett, Richard Frederick
dc.contributor.authorKing, David
dc.contributor.authorDowling, Trevor
dc.date.accessioned2015-12-13T23:35:18Z
dc.date.available2015-12-13T23:35:18Z
dc.date.issued1999
dc.date.updated2015-12-12T09:39:25Z
dc.description.abstractMany important processes occur at surfaces and interfaces on timescales ranging from milliseconds up to hours. The advent of third generation synchrotrons provides X-ray fluxes sufficiently high that it is now conceivable that these processes can be studied with millisecond time resolution using X-ray reflectometry. Several configurations for an X-ray reflectometer designed to measure X-ray reflectivity profiles with this time resolution are examined. The feasibility of each configuration in terms of information retrieval from reflectivity data is explored by application of modelling techniques to simulated 'experimental' data.
dc.identifier.issn0004-9506
dc.identifier.urihttp://hdl.handle.net/1885/93853
dc.publisherCSLI Publications
dc.sourceAustralian Journal of Physics
dc.titleA millisecond X-ray reflectometer
dc.typeJournal article
local.bibliographicCitation.lastpage100
local.bibliographicCitation.startpage87
local.contributor.affiliationWhite, John, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationBrown, A S, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationGarrett, Richard Frederick, Australian Nuclear Science and Technology Organisation
local.contributor.affiliationKing, David, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationDowling, Trevor, College of Physical and Mathematical Sciences, ANU
local.contributor.authoremailu8506305@anu.edu.au
local.contributor.authoruidWhite, John, u8506305
local.contributor.authoruidBrown, A S, u950430
local.contributor.authoruidKing, David, u8307819
local.contributor.authoruidDowling, Trevor, u8000453
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.absfor030606 - Structural Chemistry and Spectroscopy
local.identifier.ariespublicationMigratedxPub25275
local.identifier.citationvolume52
local.identifier.scopusID2-s2.0-21844455093
local.identifier.uidSubmittedByMigrated
local.type.statusPublished Version

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