Track Formation and Surface Evolution in Indium Phosphide Irradiated by Swift Heavy Ions
Date
2005
Authors
Khalil, Ali S
Chadderton, Lewis
Stewart, Andrew
Ridgway, Mark C
Llewellyn, David
Byrne, Aidan
Journal Title
Journal ISSN
Volume Title
Publisher
Pergamon-Elsevier Ltd
Abstract
Transmission electron microscopy (TEM) and atomic force microscopy (AFM) have been used to study radiation effects in 200 MeV Au ion-irradiated InP single crystals. The observations reveal the presence of individual tracks of intermittent nature about 10
Description
Keywords
Keywords: Amorphization; Amorphous materials; Atomic force microscopy; Heavy ions; Irradiation; Radiation effects; Single crystals; Surface roughness; Transmission electron microscopy; Ion irradiation; Track cores; Track formation; Semiconducting indium phosphide
Citation
Collections
Source
Radiation Measurements
Type
Journal article
Book Title
Entity type
Access Statement
License Rights
DOI
10.1016/j.radmeas.2005.05.018
Restricted until
2037-12-31