Temperature and injection-dependent lifetime spectroscopy of copper-related defects silicon
Macdonald, D; Cuevas, Andres; Rein, S; Lichtner, P; Glunz, S.W
Description
Temperature- and injection-dependent lifetime measurements have been made on single-crystal silicon wafers containing deliberately introduced Cu precipitates. Applying the Shockley-Read-Hall model to the data from p-type samples gives an accurate characterisation of these recombination centres in the form of two independent levels – one shallow centre near the conduction band, and one deep centre. These two levels provide a useful approximation to the distributed defect band that is known to...[Show more]
Collections | ANU Research Publications |
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Date published: | 2003 |
Type: | Conference paper |
URI: | http://hdl.handle.net/1885/40879 http://digitalcollections.anu.edu.au/handle/1885/40879 |
Source: | WCPEC-3: Proceedings of 3rd World Conference on Photovoltaic Energy Conversion |
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File | Description | Size | Format | Image |
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Macdonald-1P-C3-05.pdf | 532.67 kB | Adobe PDF |
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